XPS (X-ray Photoelectron Spectroscopy) and UPS (Ultraviolet Photoelectron Spectroscopy) spectroscopy are advanced analytical techniques that allow for precise examination of the chemical composition and electronic structure of materials. Thanks to these methods, we are able to obtain detailed information on the elemental composition of the surface, the degree of oxidation and the chemical properties of the layers.
XPS/UPS measurements are used for the analysis of thin-film coatings, semiconductor materials and in nanomaterial research, supporting the development of new technologies and the optimization of industrial processes.
Details:
• EA15 UHV Hemispherical Energy Analyzer
• High power monochromatic AlKα & AgLα X-ray source
• Non-monochromatic AlKα & MgKα X-ray source
• Non-monochromatic UV source
• Electron source for sample charge neutralization
• Ion source for depth profiling and surface etching
• Various sample carrier sizes: from 10×10 mm to 1 inch
• Motorized 4-axis manipulator
