Surface topography measurements enable detailed examination of the surface structure of materials at the micro- and nanoscale level. Thanks to advanced measurement technologies, we are able to determine roughness, texture and other surface parameters that have a key impact on the mechanical, chemical and optical properties of materials:
• non-contact measurement of height dierences, roughness and
surface mapping,
• variety of materials: metals, plastics, ceramics (except glass) can
be measured,
• our lab operates on Filmetrics' Profilm3D.
Profilometer specification:
• Thickness range, WLI: 50 nm - 10 mm
• Thickness range, PSI: 0 - 3 m
• Z- axis range: 37 mm
• X-Y stage range: 100 mm by 100 mm
• Motorised stage
