Accurate measurement of layer thickness is a key element of quality control and optimization of production processes. We offer specialized measurements of thin layers using advanced techniques that allow precise determination of the thickness of coatings with various physical and chemical properties.
Our measurement methods provide high accuracy regardless of the type of material or deposition technology. This allows for maintaining consistent production parameters, improving the quality of the final product and quickly detecting any irregularities.
Profilometer specification:
• Thickness range, WLI: 50 nm - 10 mm
• Thickness range, PSI: 0 - 3 m
• Z- axis range: 37 mm
• X-Y stage range: 100 mm by 100 mm
• Motorised stage
